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IEC
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IEC 62271-100 Amd.2 Ed. 1.0 b:2006
$59.85 $133.00 7024 In stockReduced price!IEC 62271-100 Amd.2 Ed. 1.0 b:2006 [ Withdrawn ] Amendment 2 - High-voltage switchgear and controlgear - Part 100: High-voltage alternating-current circuit-breakers Amendment by International Electrotechnical Commission, 07/24/2006 -
IEC 61189-6 Ed. 1.0 en:2006
$74.70 $166.00 7709 In stockReduced price!IEC 61189-6 Ed. 1.0 en:2006 Test methods for electrical materials, interconnection structures and assemblies - Part 6: Test methods for materials used in manufacturing electronic assemblies standard by International Electrotechnical Commission, 07/24/2006 -
IEC 60749-39 Ed. 1.0 b:2006
$21.15 $47.00 3962 In stockReduced price!IEC 60749-39 Ed. 1.0 b:2006 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components standard by International Electrotechnical Commission, 07/24/2006 -
IEC 60598-1 Amd.1 Ed. 6.0 b:2006
$17.10 $38.00 1918 In stockReduced price!IEC 60598-1 Amd.1 Ed. 6.0 b:2006 [ Withdrawn ] Amendment 1 - Luminaires - Part 1: General requirements and tests Amendment by International Electrotechnical Commission, 07/24/2006 -
IEC 60601-2-2 Ed. 4.0 b:2006
$112.50 $250.00 4412 In stockReduced price!IEC 60601-2-2 Ed. 4.0 b:2006 [ Withdrawn ] Medical electrical equipment - Part 2-2: Particular requirements for the safety of high frequency surgical equipment standard by International Electrotechnical Commission, 07/19/2006 -
IEC 61577-1 Ed. 2.0 b:2006
$73.80 $164.00 3257 In stockReduced price!IEC 61577-1 Ed. 2.0 b:2006 Radiation protection instrumentation - Radon and radon decay product measuring instruments - Part 1: General principles standard by International Electrotechnical Commission, 07/19/2006 -
IEC 60749-26 Ed. 2.0 b:2006
$35.55 $79.00 3749 In stockReduced price!IEC 60749-26 Ed. 2.0 b:2006 [ Withdrawn ] Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) standard by International Electrotechnical Commission, 07/18/2006 -
IEC 62373 Ed. 1.0 b:2006
$36.90 $82.00 2235 In stockReduced price!IEC 62373 Ed. 1.0 b:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) standard by International Electrotechnical Commission, 07/18/2006 -
IEC 60749-35 Ed. 1.0 b:2006
$73.80 $164.00 2392 In stockReduced price!IEC 60749-35 Ed. 1.0 b:2006 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components standard by International Electrotechnical Commission, 07/18/2006 -
IEC 60749-27 Ed. 2.0 b:2006
$36.90 $82.00 2915 In stockReduced price!IEC 60749-27 Ed. 2.0 b:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) standard by International Electrotechnical Commission, 07/18/2006 -
IEC 60191-2 Amd.14 Ed. 1.0 b:2006
$21.15 $47.00 2627 In stockReduced price!IEC 60191-2 Amd.14 Ed. 1.0 b:2006 Amendment 14 - Mechanical standardization of semiconductor devices - Part 2: Dimensions Amendment by International Electrotechnical Commission, 07/17/2006 -
IEC 60191-2 Amd.13 Ed. 1.0 b:2006
$36.90 $82.00 7800 In stockReduced price!IEC 60191-2 Amd.13 Ed. 1.0 b:2006 Amendment 13 - Mechanical standardization of semiconductor devices - Part 2: Dimensions Amendment by International Electrotechnical Commission, 07/17/2006
