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IEC 60749-4 Ed. 1.0 b CORR1:2003
$5.35 $11.88 3547 In stockReduced price!IEC 60749-4 Ed. 1.0 b CORR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) Corrigenda by International Electrotechnical Commission, 08/12/2003 -
IEC 60749-6 Ed. 1.0 b CORR1:2003
$5.35 $11.88 4838 In stockReduced price!IEC 60749-6 Ed. 1.0 b CORR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature Corrigenda by International Electrotechnical Commission, 08/12/2003 -
IEC 60749-3 Ed. 1.0 b CORR1:2003
$5.35 $11.88 7352 In stockReduced price!IEC 60749-3 Ed. 1.0 b CORR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination Corrigenda by International Electrotechnical Commission, 08/12/2003 -
IEC 62040-3 Ed. 1.0 b CORR1:2003
$5.35 $11.88 6468 In stockReduced price!IEC 62040-3 Ed. 1.0 b CORR1:2003 Corrigendum 1 - Uninterruptible power systems (UPS) - Part 3: Method of specifying the performance and test requirements Corrigenda by International Electrotechnical Commission, 07/31/2003 -
IEC 60112 Ed. 4.0 b CORR1:2003
$5.35 $11.88 8992 In stockReduced price!IEC 60112 Ed. 4.0 b CORR1:2003 Corrigendum 1 - Method for the determination of the proof and the comparative tracking indices of solid insulating materials Corrigenda by International Electrotechnical Commission, 06/19/2003 -
IEC 60749-7 Ed. 1.0 b CORR1:2003
$5.35 $11.88 1029 In stockReduced price!IEC 60749-7 Ed. 1.0 b CORR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases Corrigenda by International Electrotechnical Commission, 08/12/2003 -
IEC 60749-8 Ed. 1.0 b CORR2:2003
$5.35 $11.88 8248 In stockReduced price!IEC 60749-8 Ed. 1.0 b CORR2:2003 Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing Corrigenda by International Electrotechnical Commission, 08/12/2003 -
IEC 60749-12 Ed. 1.0 b CORR1:2003
$5.35 $11.88 1278 In stockReduced price!IEC 60749-12 Ed. 1.0 b CORR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency Corrigenda by International Electrotechnical Commission, 08/13/2003 -
IEC 60749-2 Ed. 1.0 b CORR1:2003
$5.35 $11.88 4647 In stockReduced price!IEC 60749-2 Ed. 1.0 b CORR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure Corrigenda by International Electrotechnical Commission, 08/12/2003 -
IEC 60749-1 Ed. 1.0 b CORR1:2003
$5.35 $11.88 4425 In stockReduced price!IEC 60749-1 Ed. 1.0 b CORR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General Corrigenda by International Electrotechnical Commission, 08/12/2003 -
IEC 60749-9 Ed. 1.0 b CORR1:2003
$5.35 $11.88 3525 In stockReduced price!IEC 60749-9 Ed. 1.0 b CORR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking Corrigenda by International Electrotechnical Commission, 08/12/2003 -
IEC 60749-13 Ed. 1.0 b CORR1:2003
$5.35 $11.88 8047 In stockReduced price!IEC 60749-13 Ed. 1.0 b CORR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere Corrigenda by International Electrotechnical Commission, 08/13/2003
