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BS DD ENV 50218:1996
BS DD ENV 50218:1996 Description of a parametrized European mini test chip
standard by BSI Group, 09/15/1996
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M00010624
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Full Description
Documents the parametrized MOS test structures of the device model Parameter extraction Test Chip (PTC) of the European Mini Test Chip (ETC).Cross References:
CENELEC R117-001
CENELEC R117-004
CENELEC R117-005
CENELEC R117-006
CENELEC R117-10
CENELEC prENV 50208-6
CENELEC ENV 50219
