Could I help you?
Cart 0
0 item(s) - $0.00

No products

To be determined Shipping
$0.00 Total

Check out

Quantity
Total
Product successfully added to your shopping cart
There are 0 items in your cart. There are 0 items in your cart.
Total
Continue shopping Proceed to checkout

IEC 62374-1 Ed. 1.0 b:2010

IEC 62374-1 Ed. 1.0 b:2010 Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

standard by International Electrotechnical Commission, 09/29/2010

More details

Reduced price!
M00002397
New product
Limited time offer:

$42.75

$95.00

-55%

In stock

- +

Add to compare

 
More info

Full Description

IEC 62374-1:2010 describes a test method, test structure and lifetime estimation method of the time-dependent dielectric breakdown (TDDB) test for inter-metal layers applied in semiconductor devices.

Product Details

Edition: 1.0 Published: 09/29/2010 Number of Pages: 32 File Size: 1 file , 490 KB Note: This product is unavailable in Ukraine, Russia, Belarus

 
Custom tab

This is a custom block edited from admin panel.You can insert any content here.

30 other products in the same category:

Compare 0
Prev
IEC 62475 Ed. 1.0 b:2010
Next
IEC 60269-6 Ed. 1.0 b:2010
Search

No products

To be determined Shipping
$0.00 Total

Check out

Continue shopping Compare