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IEC 60759 Ed. 1.0 b:1983

IEC 60759 Ed. 1.0 b:1983

IEC 60759 Ed. 1.0 b:1983 Standard test procedures for semiconductor X-ray energy spectrometers

standard by International Electrotechnical Commission, 01/01/1983

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Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.

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Edition: 1.0 Published: 01/01/1983 Number of Pages: 97 File Size: 1 file , 4.5 MB

 
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