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IEC 60410 Ed. 1.0 b:1973

IEC 60410 Ed. 1.0 b:1973

IEC 60410 Ed. 1.0 b:1973 [ Withdrawn ] Sampling plans and procedures for inspection by attributes

standard by International Electrotechnical Commission, 01/01/1973

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Establishes sampling plans and procedures for inspection by attributes. These sampling plans are applicable, but not limited, to inspection of end items, components and raw materials, operations, materials in process, supplies in storage, maintenance operations, data or records and administrative procedures.

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Edition: 1.0 Published: 01/01/1973 Number of Pages: 82 File Size: 1 file , 5.6 MB

 
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