IEC 62435-2 Ed. 1.0 b:2017

IEC 62435-2 Ed. 1.0 b:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

standard by International Electrotechnical Commission, 01/24/2017

More details

Reduced price!

M00011328

New product

Limited time offer:

$52.65

$117.00

-55%

In stock

- +

Add to compare

More info
Custom tab

More info

Full Description

IEC62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.