Could I help you?
Cart 0
0 item(s) - $0.00

No products

To be determined Shipping
$0.00 Total

Check out

Quantity
Total
Product successfully added to your shopping cart
There are 0 items in your cart. There are 0 items in your cart.
Total
Continue shopping Proceed to checkout
IEC 60749-9 Ed. 1.0 b:2002

IEC 60749-9 Ed. 1.0 b:2002

IEC 60749-9 Ed. 1.0 b:2002 [ Withdrawn ] Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

standard by International Electrotechnical Commission, 04/12/2002

More details

Reduced price!
M00011541
New product
Limited time offer:

$10.35

$23.00

-55%

In stock

- +

Add to compare

 
More info

Full Description

Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all package types. The test should be considered non-destructive.

Product Details

Edition: 1.0 Published: 04/12/2002 Number of Pages: 9 File Size: 1 file , 410 KB

 
Custom tab

This is a custom block edited from admin panel.You can insert any content here.

30 other products in the same category:

Compare 0
Prev
IEC 61577-3 Ed. 1.0 b:2002
Next
IEC 60749-6 Ed. 1.0 b:2002
Search

No products

To be determined Shipping
$0.00 Total

Check out

Continue shopping Compare