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IEC 61164 Ed. 2.0 en:2004

IEC 61164 Ed. 2.0 en:2004

IEC 61164 Ed. 2.0 en:2004 Reliability growth - Statistical test and estimation methods

standard by International Electrotechnical Commission, 03/24/2004

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Gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.

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Edition: 2.0 Published: 03/24/2004 Number of Pages: 55 File Size: 1 file , 780 KB

 
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