Cart
0
0
item(s)
-
$0.00
No products
To be determined
Shipping
$0.00
Total
Quantity
Total
Product successfully added to your shopping cart
There are 0 items in your cart.
There are 0 items in your cart.
Total
IEC 60749-13 Ed. 2.0 b:2018
IEC 60749-13 Ed. 2.0 b:2018 Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
standard by International Electrotechnical Commission, 02/15/2018
Reduced price!
M00014776
New product
Full Description
IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).
