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IEC 60749-43 Ed. 1.0 b:2017

IEC 60749-43 Ed. 1.0 b:2017

IEC 60749-43 Ed. 1.0 b:2017 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

standard by International Electrotechnical Commission, 06/15/2017

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IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

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Edition: 1.0 Published: 06/15/2017 Number of Pages: 74 File Size: 1 file , 1.1 MB

 
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