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IEC 61189-5-503 Ed. 1.0 en:2017

IEC 61189-5-503 Ed. 1.0 en:2017

IEC 61189-5-503 Ed. 1.0 en:2017 Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards

standard by International Electrotechnical Commission, 05/22/2017

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IEC 61189-5-503:2017(E) specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).

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Edition: 1.0 Published: 05/22/2017 Number of Pages: 23 File Size: 1 file , 680 KB

 
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