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IEC 62416 Ed. 1.0 b:2010

IEC 62416 Ed. 1.0 b:2010

IEC 62416 Ed. 1.0 b:2010 Semiconductor devices - Hot carrier test on MOS transistors

standard by International Electrotechnical Commission, 04/26/2010

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IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

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Edition: 1.0 Published: 04/26/2010 Number of Pages: 20 File Size: 1 file , 890 KB

 
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