STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
Product Details
Edition: 1.0 Published: 11/07/2007 Number of Pages: 39 File Size: 1 file , 1 MB
Custom tab
This is a custom block edited from admin panel.You can insert any content here.