Specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, it does not specify tests for whiskers that may grow as a result of external mechanical stress. This test method is employed by a relevant specification (international component or application specification) with transfer of the test severities to be applied and with defined acceptance criteria. Where tests described in this standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable.
Product Details
Edition: 1.0 Published: 05/23/2007 Number of Pages: 32 File Size: 1 file , 870 KB
Custom tab
This is a custom block edited from admin panel.You can insert any content here.