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IEC 60749-27 Amd.1 Ed. 2.0 b:2012
IEC 60749-27 Amd.1 Ed. 2.0 b:2012 Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Amendment by International Electrotechnical Commission, 09/25/2012
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M00018982
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