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IEC 60749-31 Ed. 1.0 b:2002

IEC 60749-31 Ed. 1.0 b:2002

IEC 60749-31 Ed. 1.0 b:2002 Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

standard by International Electrotechnical Commission, 08/30/2002

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Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.

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Edition: 1.0 Published: 08/30/2002 Number of Pages: 9 File Size: 1 file , 330 KB

 
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