Could I help you?
Cart 0
0 item(s) - $0.00

No products

To be determined Shipping
$0.00 Total

Check out

Quantity
Total
Product successfully added to your shopping cart
There are 0 items in your cart. There are 0 items in your cart.
Total
Continue shopping Proceed to checkout
IEC 61967-6 Ed. 1.0 b:2002

IEC 61967-6 Ed. 1.0 b:2002

IEC 61967-6 Ed. 1.0 b:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

standard by International Electrotechnical Commission, 06/25/2002

More details

Reduced price!
M00001116
New product
Limited time offer:

$57.60

$128.00

-55%

In stock

- +

Add to compare

 
More info

Full Description

Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz.

Product Details

Edition: 1.0 Published: 06/25/2002 Number of Pages: 51 File Size: 1 file , 750 KB

 
Custom tab

This is a custom block edited from admin panel.You can insert any content here.

30 other products in the same category:

Compare 0
Prev
IEC 60984 Ed. 1.1 b:2002
Next
IEC 61243-2 Ed. 1.2 b:2002
Search

No products

To be determined Shipping
$0.00 Total

Check out

Continue shopping Compare