Could I help you?
Cart 0
0 item(s) - $0.00

No products

To be determined Shipping
$0.00 Total

Check out

Quantity
Total
Product successfully added to your shopping cart
There are 0 items in your cart. There are 0 items in your cart.
Total
Continue shopping Proceed to checkout
IEC 62374 Ed. 1.0 b:2007

IEC 62374 Ed. 1.0 b:2007

IEC 62374 Ed. 1.0 b:2007 Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

standard by International Electrotechnical Commission, 03/29/2007

More details

Reduced price!
M00001177
New product
Limited time offer:

$73.80

$164.00

-55%

In stock

- +

Add to compare

 
More info

Full Description

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

Product Details

Edition: 1.0 Published: 03/29/2007 Number of Pages: 43 File Size: 1 file , 720 KB

 
Custom tab

This is a custom block edited from admin panel.You can insert any content here.

30 other products in the same category:

Compare 0
Prev
IEC 60255-27 Ed. 1.0 b CORR1:2007
Next
IEC 61300-3-33 Ed. 3.0 b Cor.1:2023
Search

No products

To be determined Shipping
$0.00 Total

Check out

Continue shopping Compare