This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.
Abstract
New IEEE Standard - Inactive-Reserved.This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.
Product Details
Published: 07/13/2009 ISBN(s): 9780738159638, 9780738159621 Number of Pages: 56 File Size: 1 file , 1.1 MB Product Code(s): STDRES95936
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