Could I help you?

ISO 13095:2014

ISO 13095:2014 Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

standard by International Organization for Standardization, 07/15/2014

More details

Reduced price!
M00060815
New product
Limited time offer:

$62.10

$138.00

-55%

In stock

- +

Add to compare

 
More info

Full Description

ISO 13095:2014 specifies two methods for characterizing the shape of an AFM probe tip, specifically the shank and approximate tip profiles. These methods project the profile of an AFM probe tip onto a given plane, and the characteristics of the probe shank are also projected onto that plane under defined operating conditions. The latter indicates the usefulness of a given probe for depth measurements in narrow trenches and similar profiles. This International Standard is applicable to the probes with radii greater than 5u0, where u0 is the uncertainty of the width of the ridge structure in the reference sample used to characterize the probe.

 
Custom tab

This is a custom block edited from admin panel.You can insert any content here.

30 other products in the same category:

Compare 0

No products

To be determined Shipping
$0.00 Total

Check out